发明名称 Method and apparatus for detecting breakdown in ultra thin dielectric layers
摘要 A method for detecting breakdown in a dielectric layer. The method includes applying a signal to the dielectric layer, measuring a plurality of sets of readings having values, which are in relation to the signal, searching and identifying outlier readings in each of the sets, the outlier readings being defined by the fact that they have values which are significantly higher or lower than the majority of the values of the set, selecting from each of the sets, one reading which is not one of the outlier readings, and comparing the value of the one selected reading to a reference value, so that the exceeding of the value leads to the conclusion that a predefined probability is present for having a breakdown state in the layer.
申请公布号 US6777972(B2) 申请公布日期 2004.08.17
申请号 US20020127381 申请日期 2002.04.22
申请人 INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC, VZW) 发明人 ROUSSEL PHILIPPE;DEGRAEVE ROBIN;VAN DEN BOSCH GEERT
分类号 H01L21/66;(IPC1-7):G01R31/26 主分类号 H01L21/66
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