发明名称 Method for fabricating a multi-layered dielectric layer including insulating layer having Si-CH3 bond therein
摘要 A multi-layered dielectric layer wherein the adhesion characteristic of an insulating layer including a Si-CH3 bond is improved, and a method of forming the same are provided. The multi-layered dielectric layer is formed on conductive patterns and includes a first insulating layer formed of a layer having a low dielectric constant including the Si-CH3 bond. In order to improve the adhesion characteristic of the first insulating layer, an adhesion surface is formed on the surface of the first insulating layer by treating the first insulating layer with plasma. In an alternative, the adhesion characteristics of the first insulating layer is improved by forming a buffer layer on the first insulating layer so that dipole-dipole interaction occurs between the first insulating layer and the buffer layer.
申请公布号 US6777322(B2) 申请公布日期 2004.08.17
申请号 US20020255639 申请日期 2002.09.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEONG HYUN-DAM;PARK HEE-SOOK;SHIN HONG-JAE;KIM BYEONG-JUN
分类号 H01L21/31;H01L21/312;H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L21/476 主分类号 H01L21/31
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