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发明名称
SEMICONDUCTOR CHIP TEST APPARATUS
摘要
申请公布号
KR100445795(B1)
申请公布日期
2004.08.16
申请号
KR19970025903
申请日期
1997.06.19
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
CHO, GYU TAEK
分类号
G01R31/28;(IPC1-7):G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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