发明名称 APPEARANCE INSPECTION SYSTEM, QUALITY EVALUATION SYSTEM USING THE SAME AND QUALITY EVALUATION INFORMATION PROVIDING SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a technology for miniaturizing an inspector installed at a point of production and easily configuring a process condition of a detected result. SOLUTION: An appearance inspection system for obtaining an image of an inspection object and inspecting an appearance is provided with an image detector 100 for detecting the image of the inspection object and an information processor 200 for processing the image detected by the image detector 100 and determining the existence of abnormality emerging in the image of the inspection object. The image detector 100 and the information processor 200 can be connected through a network 300. The image detector 100 adds a data identifier to at least one of the detected image and its processed data and transmits it to the information processor. The information processor 200 identifies the received image based on the identifier included in the received data and determines the existence of the abnormality. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004226328(A) 申请公布日期 2004.08.12
申请号 JP20030016749 申请日期 2003.01.24
申请人 HITACHI LTD 发明人 NAKAGAKI AKIRA;TAKAGI YUJI;HIROI TAKASHI;NAKAGAWA YASUO
分类号 G01N21/956;H01L21/66;H05K3/00;(IPC1-7):G01N21/956 主分类号 G01N21/956
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