发明名称 METHOD FOR PURIFYING SINGLE CRYSTAL SILICON MEMBER FOR HEAT TREATING SEMICONDUCTOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method for purifying a single crystal silicon member for heat treating a semiconductor substrate in which a metal pollution can be remarkably reduced as compared with a polycrystal silicon boat and a purifying effect is stabilized. SOLUTION: The method for purifying the single crystal silicon member for heat treating the semiconductor substrate includes a step of cleaning the single crystal silicon member having an oxide film by an HF aqueous solution, and further a step of heat treating the semiconductor substrate in a mixed gas atmosphere of an HCl having an HCl gas concentration of 5 to 50 % and an oxygen. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004228441(A) 申请公布日期 2004.08.12
申请号 JP20030016584 申请日期 2003.01.24
申请人 TOSHIBA CERAMICS CO LTD 发明人 HAN RENSHO
分类号 H01L21/22;H01L21/324;(IPC1-7):H01L21/22 主分类号 H01L21/22
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