发明名称 Method of manufacturing a semiconductor device and semiconductor device
摘要 The invention relates to a method of manufacturing a semiconductor device (10), wherein a semiconductor element (1) provided with a number of connection regions (2) is fitted between a first, electroconductive plate (3) and a second plate (4), wherein two connection conductors (3A, 3B) are formed, from the first plate (3), for the two connection regions (2A, 2B) of the element (1), wherein a passivating encapsulation (5) is provided between the plates (3, 4) and around the element (1), and wherein the device (10) is formed by applying a mechanical separating technique in two mutually perpendicular directions (L, M). In a method according to the invention, the connection conductors (3A, 3B) are formed by providing a mask (6) on the first conducting plate (3) in such a manner that a part (3C) of the plate (3) situated between the connection regions (2A, 2B) remains exposed, which part is subsequently removed by etching. Such a method enables a very compact discrete or at least semi-discrete semiconductor device (10) to be readily obtained at low cost, while a high yield is achieved. In a preferred embodiment, also further parts (3D) of the conducting plate (3) situated at the location where the device (10) is to be sawn, cut or broken remain uncovered by the mask (6) and are removed during etching.
申请公布号 US2004157376(A1) 申请公布日期 2004.08.12
申请号 US20030480113 申请日期 2003.12.09
申请人 WEEKAMP JOHANNUS WILHELMUS;DE SAMBER MARC ANDRE;DIJKEN DURANDUS KORNELIUS 发明人 WEEKAMP JOHANNUS WILHELMUS;DE SAMBER MARC ANDRE;DIJKEN DURANDUS KORNELIUS
分类号 H01L23/28;H01L21/48;H01L21/56;H01L23/051;H01L23/12;H01L23/29;H01L23/31;H01L23/538;H01L23/66;H01L25/065;(IPC1-7):H01L21/48;H01L21/44 主分类号 H01L23/28
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