| 发明名称 |
System and method for analyzing electrical failure data |
| 摘要 |
A system and method to perform analysis on test results of multiple integrated circuits. Based on the analysis, the system and method display a wafer map having map indicators representing statistical values of the test results.
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| 申请公布号 |
US2004158783(A1) |
申请公布日期 |
2004.08.12 |
| 申请号 |
US20030365997 |
申请日期 |
2003.02.12 |
| 申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
SUN XUEQING;EYOLFSON MARK;LANGWORTHY CHRIS;MAJOR KARL L. |
| 分类号 |
G01R31/319;G11C29/00;G11C29/56;(IPC1-7):G11C29/00;G01R31/28 |
主分类号 |
G01R31/319 |
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