发明名称 Methods for forming double gate electrodes using tunnel and trench
摘要 A double gate electrode for a field effect transistor is fabricated by forming in a substrate, a trench and a tunnel that extends from a sidewall of the trench parallel to the substrate. An insulating coating is formed inside the tunnel. A bottom gate electrode is formed within the insulating coating inside the tunnel. An insulating layer is formed on the substrate and a top gate electrode is formed on the insulating layer opposite the bottom gate electrode.
申请公布号 US2004157396(A1) 申请公布日期 2004.08.12
申请号 US20040773022 申请日期 2004.02.05
申请人 LEE BYEONG-CHAN;CHOI SI-YOUNG;YOO JONG-RYEOL;LEE DEOK-HYUNG;JUNG IN-SOO 发明人 LEE BYEONG-CHAN;CHOI SI-YOUNG;YOO JONG-RYEOL;LEE DEOK-HYUNG;JUNG IN-SOO
分类号 H01L21/336;H01L21/8234;H01L21/8242;H01L27/108;H01L29/786;(IPC1-7):H01L21/336 主分类号 H01L21/336
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