发明名称 Method for fabricating a MOSFET having a very small channel length
摘要 A gate layer stack formed with at least two layers is firstly patterned anisotropically and then the lower layer is etched. An isotropic, preferably selective etching step effects a lateral undercutting, i.e. removal of the lower layer as far as the predetermined channel length. This allows a T-gate transistor with a very short channel length to be fabricated dimensionally accurately, in a simple manner and cost-effectively. Its electrical switching properties are better than those of other T-gate transistors formed by conventional methods.
申请公布号 US2004157380(A1) 申请公布日期 2004.08.12
申请号 US20030673705 申请日期 2003.09.26
申请人 CAPPELLANI ANNALISA;DITTMAR LUDWIG;SCHUMANN DIRK 发明人 CAPPELLANI ANNALISA;DITTMAR LUDWIG;SCHUMANN DIRK
分类号 H01L21/3065;H01L21/265;H01L21/28;H01L21/3213;H01L21/336;H01L29/78;(IPC1-7):H01L21/335 主分类号 H01L21/3065
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