发明名称 |
Method for fabricating a MOSFET having a very small channel length |
摘要 |
A gate layer stack formed with at least two layers is firstly patterned anisotropically and then the lower layer is etched. An isotropic, preferably selective etching step effects a lateral undercutting, i.e. removal of the lower layer as far as the predetermined channel length. This allows a T-gate transistor with a very short channel length to be fabricated dimensionally accurately, in a simple manner and cost-effectively. Its electrical switching properties are better than those of other T-gate transistors formed by conventional methods.
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申请公布号 |
US2004157380(A1) |
申请公布日期 |
2004.08.12 |
申请号 |
US20030673705 |
申请日期 |
2003.09.26 |
申请人 |
CAPPELLANI ANNALISA;DITTMAR LUDWIG;SCHUMANN DIRK |
发明人 |
CAPPELLANI ANNALISA;DITTMAR LUDWIG;SCHUMANN DIRK |
分类号 |
H01L21/3065;H01L21/265;H01L21/28;H01L21/3213;H01L21/336;H01L29/78;(IPC1-7):H01L21/335 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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