发明名称 |
TREATMENT EQUIPMENT FOR SEMICONDUCTOR WAFER, AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE HAVING PHOTOENGRAVING PROCESS USING THE EQUIPMENT |
摘要 |
PROBLEM TO BE SOLVED: To uniformize the quality of a semiconductor wafer in photoengraving treatment equipment. SOLUTION: The photoengraving treatment equipment contains an air-supply path 1200 for supplying the inside of a chamber treating the wafer 1500 with air, a temperature-humidity controller 1100 installed in front of the air-supply path 1200, a temperature-humidity monitoring sensor 1300 for detecting the temperature and humidity in the chamber and a controller 1000 connected to the monitoring sensor 1300 and the controller 1100 for controlling the controller 1100 so that the inside of the chamber is supplied with air, having the same temperature and humidity as the temperature and humidity of air in the chamber detected by the monitoring sensor 1300 via the air-supply path 1200. COPYRIGHT: (C)2004,JPO&NCIPI
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申请公布号 |
JP2004228475(A) |
申请公布日期 |
2004.08.12 |
申请号 |
JP20030017269 |
申请日期 |
2003.01.27 |
申请人 |
RENESAS TECHNOLOGY CORP |
发明人 |
KATSUYA TAKAYUKI;NAGANO MASARU |
分类号 |
H01L21/027;G03F7/20;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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