发明名称 |
Method and apparatus for verification of a gate oxide fuse element |
摘要 |
The present invention relates to a method and circuit for verifying the state of a gated fuse element used with a one-time programmable CMOS memory device. A first expected state is set and a state of a first gate-ox fuse is sensed. The state of the first gate-ox fuse is compared to the first expected state to determine if they are equal, and a first signal is generated. A second expected state is set and a state of a second gate-ox fuse is sensed. The state of the second gate-ox fuse is compared to the second expected state to determine if they are equal, and a second signal is generated. A valid output is generated if both the first and second signals are in a correct state, both signals are high for example.
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申请公布号 |
US2004156224(A1) |
申请公布日期 |
2004.08.12 |
申请号 |
US20040757259 |
申请日期 |
2004.01.14 |
申请人 |
BUER MYRON J.;SMITH DOUGLAS D. |
发明人 |
BUER MYRON J.;SMITH DOUGLAS D. |
分类号 |
G11C17/16;G11C17/18;G11C29/38;(IPC1-7):G11C11/22 |
主分类号 |
G11C17/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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