发明名称 STRAINED CHANNEL FINFET
摘要 A semiconductor structure includes a fin (205) and a layer (305) formed on the fin. The fin (205) includes a first crystalline material having a rectangular cross section and a number of surfaces. The layer (305) is formed on the surfaces and includes a second crystalline material. The first crystalline material has a different lattice constant than the second crystalline material to induce tensile strain within the layer (305).
申请公布号 WO2004068585(A1) 申请公布日期 2004.08.12
申请号 WO2004US00967 申请日期 2004.01.15
申请人 ADVANCED MICRO DEVICES, INC.;DAKSHINA-MURTHY, SRIKANTESWARA;AN, JUDY, XILIN;KRIVOKAPIC, ZORAN;WANG, HAIHONG;YU, BIN 发明人 DAKSHINA-MURTHY, SRIKANTESWARA;AN, JUDY, XILIN;KRIVOKAPIC, ZORAN;WANG, HAIHONG;YU, BIN
分类号 H01L21/336;H01L29/10;H01L29/49;H01L29/786 主分类号 H01L21/336
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