A semiconductor structure includes a fin (205) and a layer (305) formed on the fin. The fin (205) includes a first crystalline material having a rectangular cross section and a number of surfaces. The layer (305) is formed on the surfaces and includes a second crystalline material. The first crystalline material has a different lattice constant than the second crystalline material to induce tensile strain within the layer (305).
申请公布号
WO2004068585(A1)
申请公布日期
2004.08.12
申请号
WO2004US00967
申请日期
2004.01.15
申请人
ADVANCED MICRO DEVICES, INC.;DAKSHINA-MURTHY, SRIKANTESWARA;AN, JUDY, XILIN;KRIVOKAPIC, ZORAN;WANG, HAIHONG;YU, BIN
发明人
DAKSHINA-MURTHY, SRIKANTESWARA;AN, JUDY, XILIN;KRIVOKAPIC, ZORAN;WANG, HAIHONG;YU, BIN