| 摘要 |
PROBLEM TO BE SOLVED: To provide a socket assembly for testing an IC chip, capable of improving reliability for electrical characteristics inspection by improving efficiency by selecting one of direct/indirect connection between a test board and the IC chip in accordance with its characteristics, and reducing the load capacity between probe pins through direct contact and terminals, the IC chip which uses the same, and a tester which uses the socket assembly. SOLUTION: The assembly comprises a guide block installed on a test board, having terminals around the test board and forming a regional range facing the terminals, while the IC chip is formed removably from/to above; a guide part provided in the inside of the guide block facing the regional range and guiding the lowering position of the IC chip so as to directly connect each probe pin with the terminals, respectively; and a pressure plate pressing the probe pins so as to be connected to each corresponding terminal with pressure projections equipped under the pressure plate. COPYRIGHT: (C)2004,JPO&NCIPI
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