发明名称 OUTPUT BUFFER, SYNCHRONOUS MEMORY DEVICE AND ACCESS TIME TESTING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an output buffer, a synchronous memory device and a measuring method. SOLUTION: This output buffer has a pull-up element for pulling up an output terminal to first power supply voltage at the time of turn-on, and a pull-down element for pulling down the output terminal to second power supply voltage that is at a level lower than the first power supply voltage at the time of the turn-on. In addition, the output buffer includes an output latching part for maintaining the pull-up element and the pull-down element in a turn-off state and maintaining the output terminal in a high impedance state in a standby mode, latching a data signal in response to the level state of an output clock signal, driving the pull-up element and the pull-down element in response to the latched data signal and outputting the data signal to the output terminal in a first operation mode, and latching the data signal in response to the front edge of the output clock signal, driving the pull-up element and the pull-down element in response to the latched data signal and outputting the data signal to the output terminal in a second operation mode. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004227753(A) 申请公布日期 2004.08.12
申请号 JP20040009697 申请日期 2004.01.16
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KIM CHI-WOOK;KIM MIN-SOO
分类号 H03K19/0175;G11C5/00;G11C7/10;G11C7/22;G11C11/40;G11C11/401;G11C11/407;G11C11/4076;G11C11/409;G11C11/4093;G11C29/00;G11C29/02;G11C29/14;G11C29/50;(IPC1-7):G11C11/409;H03K19/017 主分类号 H03K19/0175
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