| 摘要 |
A method for manufacturing a probe card, which includes a contact provided on a base substrate and electrically coupled to a terminal of an electronic device, for receiving and/or sending a signal from and/or to the electronic device, includes a first contact formation step of forming a first contact of the contacts on a first surface of a first sacrificial substrate, a second contact formation step of forming a second contact of the contacts of a first surface of a second sacrificial substrate, a signal transmission line formation step of forming a signal transmission line in the base substrate, a first contact joining step of attaching the first surface of the first sacrificial substrate to the base substrate and joining the first contact to the signal transmission line and a second contact joining step of attaching the first surface of the second sacrificial substrate to the base substrate and joining the second contact to the signal transmission line.
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