发明名称 SHALLOW TRENCH ISOLATION LAYER WITH AIR GAP AND FABRICATING METHOD THEREOF
摘要 PURPOSE: A method for fabricating a shallow trench isolation layer with an air gap is provided to reduce capacitance in a substrate while increasing a dielectric constant of an isolation layer by adding a spacer insulation layer to the inside of a trench and by forming an air gap in the trench in a process for depositing a gap-fill insulation layer. CONSTITUTION: A bottom insulation layer pattern(102) for defining a bottom region of a shallow trench isolation layer is formed on a semiconductor substrate(100). A sacrificial layer pattern in which a part of the upper surface of the bottom insulation layer pattern is exposed is formed on the substrate. After a spacer insulation layer(108a) is formed on the sidewall of the sacrificial layer pattern, the sacrificial layer pattern is eliminated. A selective epitaxial growth process is performed on the exposed substrate to form an epitaxial layer(110). A gap-fill insulation layer is deposited to fill the opening between the epitaxial layer wherein an air gap(112) is formed between the spacer insulation layers. The gap-fill insulation layer is planarized to expose the surface of the epitaxial layer so that the shallow trench isolation layer(114a) is formed.
申请公布号 KR20040070799(A) 申请公布日期 2004.08.11
申请号 KR20030006988 申请日期 2003.02.04
申请人 ANAM SEMICONDUCTOR., LTD. 发明人 KO, GWAN JU
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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