发明名称 Method for metal oxide thin film deposition via MOCVD
摘要 An MOCVD process is provided for forming metal-containing films having the general formula M'xM"(1-x)MyOz, wherein M' is a metal selected from the group consisting of La, Ce, Pr, Nd, Pm, Sm, Y, Sc, Yb, Lu, and Gd; M" is a metal selected from the group consisting of Mg, Ca, Sr, Ba, Pb, Zn, and Cd; M is a metal selected from the group consisting of Mn, Ce, V, Fe, Co, Nb, Ta, Cr, Mo, W, Zr, Hf and Ni; x has a value from 0 to 1; y has a value of 0, 1 or 2; and z has an integer value of 1 through 7. The MOCVD process uses precursors selected from alkoxide precursors, beta -diketonate precursors, and metal carbonyl precursors in combination to produce metal-containing films, including resistive memory materials.
申请公布号 EP1433874(A3) 申请公布日期 2004.08.11
申请号 EP20030258031 申请日期 2003.12.19
申请人 SHARP KABUSHIKI KAISHA 发明人 ZHUANG, WEITWEI;HSU, SHENG TENG;PAN, WEI
分类号 H01L21/205;C23C16/40;H01L21/316;H01L27/10;H01L45/00 主分类号 H01L21/205
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