发明名称 In-situ purge system for article containers
摘要 An in-situ purge system for charging the interior of a semiconductor wafer pod with nitrogen gas after the pod is exposed to ambient moisture, air and particles in a clean room. A gas supply line extends into the pod interior from a gas source, and a gas exhaust line extends from the pod interior to remove moisture, particles and excess gas from the pod interior as the pod contains a wafer-filled cassette and rests typically on a SMIF arm before transfer to a processing tool or other destination in the facility. The removable bottom door of the pod and the bottom plate of the cassette are modified to receive the gas supply line and the gas exhaust line.
申请公布号 US6772805(B2) 申请公布日期 2004.08.10
申请号 US20020303153 申请日期 2002.11.22
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD 发明人 TSAI WEN-SHAN;WANG SHU-HUA;HUANG PI-HSI;TWU ZENG-ZONG
分类号 B08B9/08;H01L21/00;H01L21/677;(IPC1-7):B65B1/04 主分类号 B08B9/08
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