| 摘要 |
An apparatus and method for using the apparatus for reducing analysis time of integrated circuits. The apparatus includes an integrated logic analyzer inserted in a substrate containing the integrated circuit and means for accelerating circuit analysis using the integrated logic analyzer. The means may be selected from the group consisting of a high speed sampling circuit coupled to the integrated logic analyzer and an on-board circuit testing and analysis apparatus including the integrated logic analyzer. Use of the apparatus enables lower production costs by speeding up circuit analysis as well as providing analysis of high speed circuits in a cost effective manner.
|
