发明名称 Semiconductor device with an silicon on insulator (soi) substrate
摘要 A semiconductor and a method of manufacturing thereof form a region with a sufficient gettering effect. A p-type channel MOSFET and an n-type channel MOSFET are formed in an n-type semiconductor layer, which is isolated in a form of islands on an SOI substrate. A high-concentration impurity diffused region is formed in such a manner as to surround the p-type channel MOSFET and the n-type channel MOSFET. The high-concentration impurity diffused region has a surface concentration of between 1x10<18 >atom/cm<3 >and 5x10<20 >atom/cm<3 >for achieving a desired gettering effect.
申请公布号 US6774454(B2) 申请公布日期 2004.08.10
申请号 US20020283912 申请日期 2002.10.30
申请人 FUJI ELECTRIC CO., LTD. 发明人 HIRABAYASHI ATSUO
分类号 H01L27/08;H01L21/322;H01L21/336;H01L21/762;H01L21/8238;H01L21/84;H01L27/092;H01L27/12;H01L29/786;(IPC1-7):H01L27/01;H01L29/00 主分类号 H01L27/08
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