发明名称 High crack resistance nitride process
摘要 A new method of creating a relatively thick layer of PE silicon nitride. A conventional method of creating a layer of silicon nitride applies a one-step process for the creation thereof. Film stress increases as the thickness of the created layer of PE silicon nitride increases. A new method is provided for the creation of a crack-resistant layer of PE silicon nitride by providing a multi-step process. The main processing step comprises the creation of a relatively thick, compressive film of PE silicon nitride, over the surface of this relatively thick layer of PE silicon nitride is created a relatively thin (between about 150 and 500 Angstrom) layer of tensile stress PE silicon nitride. This process can be repeated to create a layer of PE silicon nitride of increasing thickness. A layer of PE silicon nitride can in this manner be created to a thickness of about 4 mum, whereby this thick layer of PE silicon nitride is free of stress and therefor free of therefrom following cracking of the layer of PE silicon nitride.
申请公布号 US6774059(B1) 申请公布日期 2004.08.10
申请号 US20030417320 申请日期 2003.04.16
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY 发明人 CHUANG POYO;NI CHYI-TSONG
分类号 H01L21/318;H01L21/768;(IPC1-7):H01L21/31 主分类号 H01L21/318
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