发明名称 High density planar SRAM cell using bipolar latch-up and gated diode breakdown
摘要 Area efficient static memory cells and arrays containing p-n-p-n or n-p-n-p transistors which can be latched-up in a bistable on state. Each transistor memory cell includes a gate which is pulse biased during the write operation to latch-up the cell. Also provided are linked memory cells in which the transistors share common regions.
申请公布号 US6773968(B1) 申请公布日期 2004.08.10
申请号 US20000609813 申请日期 2000.07.03
申请人 MICRON TECHNOLOGY, INC. 发明人 FORBES LEONARD;NOBLE, JR. WENDELL P.
分类号 H01L27/102;H01L27/12;(IPC1-7):H01L21/332 主分类号 H01L27/102
代理机构 代理人
主权项
地址