发明名称 EXPOSURE APPARATUS OF SEMICONDUCTOR MANUFACTURING EQUIPMENT
摘要 PURPOSE: An exposure apparatus of semiconductor manufacturing equipment is provided to improve the resolution of a wafer without the damage due to pattern variation, the decrease of light and the degradation of uniformity by using an aperture with an improved pattern. CONSTITUTION: An exposure apparatus of semiconductor manufacturing equipment includes a circular type first reflector and the second reflector, a fly's eye lens, an aperture(10), the third reflector, a condenser lens, a mask and a transparent lens. The aperture includes a circular type light transmission region(12) and a light shielding part(11) at the center of the light transmission region. A plurality of protrusions(20) are prolonged from the light shielding part to the light transmission region.
申请公布号 KR20040069766(A) 申请公布日期 2004.08.06
申请号 KR20030006306 申请日期 2003.01.30
申请人 ANAM SEMICONDUCTOR., LTD. 发明人 LEE, IL HO
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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