| 摘要 |
PURPOSE: A multiplexer for testing a chip is provided to prevent an I/O(Input/Output) signal delay by changing a structure of the multiplexer used for testing that the mounted chip knowing no internal structure is normally operated in a design mounting many chips. CONSTITUTION: The first input line inputs the signal normally generated by the operation of a microchip. The second input line inputs a test signal for a chip test. Logical circuits invert a level of an inputted control signal to opposite, multiply a signal inputted to the second input line, and sum the multiplied signal and the signal inputted to the second input line. An output line outputs the summed signal.
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