发明名称 |
SEMICONDUCTOR TO KEEP PLANARIZATION UNIFORM AFTER CMP PROCESS AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor to keep planarization uniform after a CMP process and a fabricating method thereof are provided to maintain the planarization by performing an etch-back process using a selection ratio between a photoresist layer and an insulating layer. CONSTITUTION: A conducting line is formed on an upper surface of a silicon substrate. The first insulating layer is formed on an upper surface of the conducting line. The second insulating layer is formed on an upper surface of the first insulating layer. A planarization process using a CMP process is performed. A photoresist layer is formed thereon. The second insulating layer is etched by using the photoresist layer as a mask.
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申请公布号 |
KR20040069914(A) |
申请公布日期 |
2004.08.06 |
申请号 |
KR20030006470 |
申请日期 |
2003.01.30 |
申请人 |
ANAM SEMICONDUCTOR., LTD. |
发明人 |
SHIN, CHUNG SIK |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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地址 |
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