发明名称 |
METHOD OF IMPROVING VISCOSITY OF PHOTORESIST |
摘要 |
PURPOSE: A method is provided to improve the step coverage and viscosity of photoresist by adding pre-pattern ashing before coating the photoresist. CONSTITUTION: The first insulating layer(21), an etch stop layer(22) and the second insulating layer(23) are sequentially formed on a silicon substrate(20). A trench is formed by removing selectively the second insulating layer using the first photo process. Pre-pattern ashing is performed on the resultant structure by using O2 plasma, CxFx based gas or Ar gas. A contact hole for exposing partially the silicon substrate is formed under the trench by removing selectively the first insulating layer using the second photo process. A dual damascene pattern made of the trench and the contact hole is filled with metal.
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申请公布号 |
KR20040069780(A) |
申请公布日期 |
2004.08.06 |
申请号 |
KR20030006320 |
申请日期 |
2003.01.30 |
申请人 |
ANAM SEMICONDUCTOR., LTD. |
发明人 |
HWANG, GYU HO |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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