发明名称 METHOD OF IMPROVING VISCOSITY OF PHOTORESIST
摘要 PURPOSE: A method is provided to improve the step coverage and viscosity of photoresist by adding pre-pattern ashing before coating the photoresist. CONSTITUTION: The first insulating layer(21), an etch stop layer(22) and the second insulating layer(23) are sequentially formed on a silicon substrate(20). A trench is formed by removing selectively the second insulating layer using the first photo process. Pre-pattern ashing is performed on the resultant structure by using O2 plasma, CxFx based gas or Ar gas. A contact hole for exposing partially the silicon substrate is formed under the trench by removing selectively the first insulating layer using the second photo process. A dual damascene pattern made of the trench and the contact hole is filled with metal.
申请公布号 KR20040069780(A) 申请公布日期 2004.08.06
申请号 KR20030006320 申请日期 2003.01.30
申请人 ANAM SEMICONDUCTOR., LTD. 发明人 HWANG, GYU HO
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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