发明名称 |
WAFER CUTTING APPARATUS AND METHOD THEREOF |
摘要 |
PURPOSE: A wafer cutting apparatus and a method thereof are provided to cut precisely a wafer and to improve the stability of working by using a cutting unit with a laser beam generator. CONSTITUTION: A wafer cutting apparatus includes an optical microscope(1), a stage(2), a wafer cutting unit and a grip part. The wafer cutting unit(5) is located on the stage. The wafer cutting unit includes a laser beam generator and a support part. The grip part(4) is used for supporting the wafer while the wafer cutting unit cuts the wafer. The grip part applies physical pressure to the wafer.
|
申请公布号 |
KR20040069759(A) |
申请公布日期 |
2004.08.06 |
申请号 |
KR20030006299 |
申请日期 |
2003.01.30 |
申请人 |
ANAM SEMICONDUCTOR., LTD. |
发明人 |
KANG, JEONG HO |
分类号 |
H01L21/301;(IPC1-7):H01L21/301 |
主分类号 |
H01L21/301 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|