发明名称 WAFER CUTTING APPARATUS AND METHOD THEREOF
摘要 PURPOSE: A wafer cutting apparatus and a method thereof are provided to cut precisely a wafer and to improve the stability of working by using a cutting unit with a laser beam generator. CONSTITUTION: A wafer cutting apparatus includes an optical microscope(1), a stage(2), a wafer cutting unit and a grip part. The wafer cutting unit(5) is located on the stage. The wafer cutting unit includes a laser beam generator and a support part. The grip part(4) is used for supporting the wafer while the wafer cutting unit cuts the wafer. The grip part applies physical pressure to the wafer.
申请公布号 KR20040069759(A) 申请公布日期 2004.08.06
申请号 KR20030006299 申请日期 2003.01.30
申请人 ANAM SEMICONDUCTOR., LTD. 发明人 KANG, JEONG HO
分类号 H01L21/301;(IPC1-7):H01L21/301 主分类号 H01L21/301
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