发明名称 |
APPARATUS AND METHOD FOR FABRICATING S.R.P SPECIMEN |
摘要 |
PURPOSE: An apparatus and a method for fabricating an S.R.P specimen are provided to exactly analyze S.R.P and know S.R.P results through difference angles by means of the same specimen by designing a specimen holder capable of moving in up and down directions and by resetting an angle of the specimen. CONSTITUTION: An apparatus for fabricating S.R.P specimen includes a lower supporting part(4), a fixture upper layer part(5), a movement upper layer part(6), and a position change unit(7). The lower supporting part(4) is a plate type and a V-shape groove. The fixture upper part(5) is fixed to a plane surface of the lower supporting part(4). The movement upper layer part(6) is spaced from the fixture upper layer(6) by a predetermined angle. A method for fabricating S.R.P specimen establishes an angle of a specimen to be measured by adjusting the movement upper layer part(6).
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申请公布号 |
KR20040069761(A) |
申请公布日期 |
2004.08.06 |
申请号 |
KR20030006301 |
申请日期 |
2003.01.30 |
申请人 |
ANAM SEMICONDUCTOR., LTD. |
发明人 |
KIM, DONG GYO |
分类号 |
G01B11/00;(IPC1-7):G01B11/00 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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