发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a high-speed SiGe bipolar transistor in which an operation is hardly varied. SOLUTION: The SiGe bipolar transistor has a semiconductor substrate, a first conductivity type collector layer on the substrate, a second conductivity type base layer brought into contact with the collector layer and formed by an epitaxial growth so that germanium is contained in at least a part, and a first conductivity type emitter layer brought into contact with the base layer and formed by the epitaxial growth. The emitter layer contains germanium and carbon. Carbon contained in the emitter layer prevents the diffusion of a dopant, and germanium has action in which the change of a lattice constant by carbon doping is compensated and the emitter layer is lattice-matched with a semiconductor substrate material. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004221195(A) 申请公布日期 2004.08.05
申请号 JP20030004762 申请日期 2003.01.10
申请人 FUJITSU LTD 发明人 OCHIMIZU HIROAKI;SAKOTA TSUNEHISA;IWAI DAISUKE
分类号 H01L21/331;H01L21/20;H01L29/732;H01L29/737;(IPC1-7):H01L21/331 主分类号 H01L21/331
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