发明名称 SUBSTRATE TREATMENT APPARATUS
摘要 PROBLEM TO BE SOLVED: To shorten a substrate treatment time when growing a thin film on a substrate by surface reaction. SOLUTION: A purge line 12 in a susceptor region can introduce, for example, a helium gas with thermal conductivity higher than a nitrogen gas, and is provided in a placement unit 20. In a temperature increase process for heating the substrate 200 up to a treatment temperature, the helium gas with high thermal conductivity is introduced into the placement unit 20 by purge line 12 in the susceptor. As a result, heat in the heating means is efficiently transmitted to a substrate placement table for shortening the substrate heating time. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004221214(A) 申请公布日期 2004.08.05
申请号 JP20030005230 申请日期 2003.01.14
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 NOUCHI HIDEHIRO;KASATSUGU KATSUNAO;WADA TETSUYA;ISHIZAKA MITSUNORI
分类号 C23C16/455;C23C16/46;H01L21/205;(IPC1-7):H01L21/205 主分类号 C23C16/455
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