| 摘要 |
Methods and devices are disclosed for measuring barrier properties of a barrier coating or coating arrays where each barrier coating has a small cross section. To reduce the edge effects in the measurements of barrier properties, measurements are made using a substrate which can be flat, cylindrical or spherical structure coated with a chemically sensitive layer, a solvent resistant layer and an array of barrier coatings. The coated substrate which can be flat, cylindrical or spherical is exposed to a material of interest that has the ability to produce an analyzable variation in the chemically sensitive layer, thereby providing the ability to detect an impact of the material of interest on the barrier coatings. In one variation, an optical radiation interacts with the substrate structure, a resulting initial optical radiation associated with the initial optical radiation and each barrier coating is detected, and any impacts on the coatings by the material of interest are correlated to a value of a barrier property for each of the array of barrier coatings.
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