发明名称 |
ELECTRON MICROSCOPE INCLUDING VACUUM CONTAINER, VACUUM PUMP, ELECTRON SOURCE, SAMPLE CHAMBER AND ELECTRON BEAM DETECTOR INTEGRATED INTO SINGLE UNIT |
摘要 |
PURPOSE: An electron microscope is provided to reduce weight and space occupation of the microscope and shorten the start time of the microscope. CONSTITUTION: An electron microscope comprises an electron microscope housing(11), and a display(10) arranged in the electron microscope housing. The electron microscope housing accommodates a vacuum container(14); a vacuum pump(12) for vacuum exhausting air from the vacuum container; an electron source(13) attached on the vacuum container; a sample chamber(16) attached beneath the vacuum container in such a manner that the sample chamber is protrusile from the electron microscope housing; and an electron beam detector(15) for detecting electron beams from a sample arranged in the sample chamber. The vacuum container, vacuum pump, electron source, sample chamber, and the electron beam detector are integrated into a single unit in the electron microscope housing.
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申请公布号 |
KR20040069250(A) |
申请公布日期 |
2004.08.05 |
申请号 |
KR20030057081 |
申请日期 |
2003.08.19 |
申请人 |
KABUSHIKI KAISHA HITACHI SEISAKUSHO(D/B/A HITACHI, LTD.) |
发明人 |
HAYASHIBARA MITSUO;HIDAKA KISHIO;HORIUCHI TOSHIAKI;FUJIEDA TADASHI;NUMATA YOSHIMICHI;SUZUKI SHUUICHI |
分类号 |
H01J37/26;G01Q30/16;G01Q70/12;H01J37/02;H01J37/28;(IPC1-7):H01J37/26 |
主分类号 |
H01J37/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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