发明名称 Plasma processor
摘要 This invention includes a first filter (27) connected between a susceptor (21) and ground and having a variable impedance, a sensor (28) for detecting an electrical signal based on the state of a plasma (P) generated in a process chamber (11), and a control means (36) for controlling the impedance of the first filter (27) on the basis of a detection result output from the sensor (28). Thus, a preferable plasma distribution to match the object of the plasma process can be realized.
申请公布号 US2004149221(A1) 申请公布日期 2004.08.05
申请号 US20030477456 申请日期 2003.11.12
申请人 KOSHIMIZU CHISHIO;YAMAZAWA YOHEI 发明人 KOSHIMIZU CHISHIO;YAMAZAWA YOHEI
分类号 H05H1/00;B01J19/08;C23C16/509;H01J37/32;H01L21/205;H01L21/302;H01L21/3065;H01L21/31;H05H1/46;(IPC1-7):H01L21/306;H01L21/306 主分类号 H05H1/00
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