发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 <p>A semiconductor device including a nitride semiconductor layer comprises a buffer layer (2) which is formed on a silicon substrate (1) and has a structure wherein first layers (8) composed of AlN, third layers (10) composed of p-type GaN and second layers (9) composed of GaN are alternately arranged. A main semiconductor region (3) comprising a nitride semiconductor layer for formation of an HEMT is arranged on the buffer layer (2). The third layers (10) have a thickness of 0.5-50 nm. The third layers (10) have an effect of suppressing production of a two-dimensional electron gas. Consequently, lowering of resistance of the buffer layer (2) is prevented.</p>
申请公布号 WO2004066393(A1) 申请公布日期 2004.08.05
申请号 WO2004JP00183 申请日期 2004.01.14
申请人 SANKEN ELECTRIC CO., LTD.;YANAGIHARA, MASATAKA;SATO, MASAHIRO;MOKU, TETSUJI 发明人 YANAGIHARA, MASATAKA;SATO, MASAHIRO;MOKU, TETSUJI
分类号 H01L29/15;H01L29/20;H01L29/778;(IPC1-7):H01L29/778 主分类号 H01L29/15
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