发明名称 Anti-reflection coatings for semiconductor lasers
摘要 The present invention concerns an anti-reflection coating for semiconductor lasers, in particular a coating on the laser facet with advantageous properties resulting in improved reliability and reduced probability of specific breakdowns, especially so-called catastrophic optical damages (CODs). It is a quarter-wave coating with a predetermined reflectivity, preferably between 0 and 10% and consists of or comprises SiNx:H. It is preferably applied by a Plasma-Enhanced Chemical Vapor Deposition (PE-CVD) process whose process parameters are controlled such that a desired optical thickness and refractive index of the coating are achieved. The PE-CVD process may be controlled to result in an Si/N ratio between about 0.5 and 1.5 and/or to produce a coating of essentially amorphous SiNx:H whose density approaches the density of crystalline Si3N4.
申请公布号 US2004151226(A1) 申请公布日期 2004.08.05
申请号 US20030735375 申请日期 2003.12.12
申请人 WITTMANN ANDREAS;GOTZA MARTIN;SOLAR MICHAEL;LATTA ERNST-EBERHARD;KELLNER TIM;KREJCI MARTIN 发明人 WITTMANN ANDREAS;GOTZA MARTIN;SOLAR MICHAEL;LATTA ERNST-EBERHARD;KELLNER TIM;KREJCI MARTIN
分类号 H01S5/028;H01S5/10;(IPC1-7):H01S5/00 主分类号 H01S5/028
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