发明名称 Method to assist identification of a defective functional unit in a technical system
摘要 In a method to assist in the identification of a defective functional unit in a technical system that includes a number of functional units, a first test is implemented on the technical system for identification, the first tests implementing a measurement on the technical system and providing a first test result. Using a test model in which information is compiled about which functional units were tested, and using a system model in which information is compiled about the assembly of the technical system, an automated processing of the first test results is implemented. The first test result is analyzed in order to determine a group of functional units that may be defective, and using the analysis of the functional units of the group, defect probabilities are assigned.
申请公布号 US2004153819(A1) 申请公布日期 2004.08.05
申请号 US20030663068 申请日期 2003.09.16
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 BJORSNE TORD;DRESEL HOLGER
分类号 G01M99/00;G01R31/28;G05B23/02;G06Q50/00;(IPC1-7):H04B1/74 主分类号 G01M99/00
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