发明名称 |
Method for comparing the address of a memory access with an already known address of a faulty memory cell |
摘要 |
A comparison method compares the address of a memory cell with a known address of a faulty memory cell in a semiconductor memory module. The module is subdivided into banks and has an address structure in which each address is associated with a bank that is organized in rows and columns and is defined by a row address, a column address and a bank address. Not only the row address is determined, but also the column address and the bank address when a memory access occurs. A bank is activated with a bank selection signal, and the access to a valid address of a faulty memory cell is indicated by an enable register.
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申请公布号 |
US2004153843(A1) |
申请公布日期 |
2004.08.05 |
申请号 |
US20030689422 |
申请日期 |
2003.10.20 |
申请人 |
KAISER ROBERT;SCHAMBERGER FLORIAN |
发明人 |
KAISER ROBERT;SCHAMBERGER FLORIAN |
分类号 |
G11C29/04;G11C8/00;G11C11/401;(IPC1-7):H04B1/74 |
主分类号 |
G11C29/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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