发明名称 METHOD FOR OPTICAL SHORT RANGE CORRECTION DESIGN OF CONTACT HOLE MASK
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for optimizing an illumination distribution of a pattern which should be formed on a substrate surface. <P>SOLUTION: The illumination is optimized by defining a transmission cross coefficient ("TCC") function determined correspondingly by a lighting pupil and a projection pupil according to a lighting device, by expressing at least one impulse function for resolvable features of at least one of masks which should be printed to a substrate, and by further making an interference map of a specified order based on at least one impulse function and the TCC function. The interference map represents at least one resolvable feature which should be printed to the substrate, and an interference region weakened each other. <P>COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004221594(A) 申请公布日期 2004.08.05
申请号 JP20040007029 申请日期 2004.01.14
申请人 ASML MASKTOOLS BV 发明人 SOCHA ROBERT JOHN;SHI XUELONG;VAN DEN BROKE DOUGLAS;CHEN JANG FUNG
分类号 G02B21/14;G02B21/16;G03F1/00;G03F1/36;G03F7/20;H01L21/027 主分类号 G02B21/14
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