Method for writing to a defect address memory, and test circuit having a defect address memory

摘要

Method and circuit for writing defect data to a defect address memory in a test system, the defect data indicating whether there is a defect in a memory area of a memory component to be tested, an address in the defect address memory being associated with the memory area, and the address of the defect address memory only being written to when the defect data item indicates a defect.