发明名称 Insitu post atomic layer deposition destruction of active species
摘要 Systems and methods for insitu post atomic layer deposition (ALD) destruction of active species are provided. ALD processes deposit multiple atomic layers on a substrate. Pre-cursor gases typically enter a reactor and react with the substrate resulting in a monolayer of atoms. After the remaining gas is purged from the reactor, a second pre-cursor gas enters the reactor and the process is repeated. The active species of some pre-cursor gases do not readily purge from the reactor, thus increasing purge time and decreasing throughput. A high-temperature surface placed in the reactor downstream from the substrate substantially destroys the active species insitu. Substantially destroying the active species allows the reactor to be readily purged, increasing throughput.
申请公布号 US2004152304(A1) 申请公布日期 2004.08.05
申请号 US20030356981 申请日期 2003.01.30
申请人 MICRON TECHNOLOGY, INC. 发明人 SARIGIANNIS DEMETRIUS;MENG SHUANG;DERDERIAN GARO J.
分类号 C23C16/44;C23C16/455;C23C16/46;H01L21/285;H01L21/316;(IPC1-7):H01L21/44;H01L21/31;H01L21/469 主分类号 C23C16/44
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