发明名称 Semiconductor device and method of manufacturing the same
摘要 Wirings including first conductive layer patterns and insulating mask layer patterns are formed on a substrate. Insulating spacers are formed on sidewalls of the wirings. Self-aligned contact pads including portions of a second conductive layer are formed to contact with surfaces of the insulating spacers and to fill up a gap between the wirings. An interlayer dielectric layer is formed on the substrate where the contact pads are formed and is then partially etched to form contact holes exposing the contact pads. A selective epitaxial silicon layer is formed on the contact pads exposed through the contact holes to cover the insulating mask layer patterns. Thus, a short-circuit between the lower wiring and an upper wiring formed in the contact holes is prevented.
申请公布号 US2004149992(A1) 申请公布日期 2004.08.05
申请号 US20030688017 申请日期 2003.10.16
申请人 PARK BYUNG-JUN;KIM JI-YOUNG 发明人 PARK BYUNG-JUN;KIM JI-YOUNG
分类号 H01L21/28;H01L21/60;H01L21/768;H01L21/8242;H01L27/02;H01L27/108;(IPC1-7):H01L21/00 主分类号 H01L21/28
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