发明名称 SONOS MEMORY ELEMENT EQUIPPED WITH SIDE GATE AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a SONOS memory element and a method for manufacturing the same. SOLUTION: The SONOS memory element comprising a semiconductor substrate, an insulating film formed on the semiconductor substrate, an active layer formed on a predetermined region of the insulating film and defined into a source, a drain, and a channel region, and first and second side gate laminations stacked on each of both sides of the channel region and the method for manufacturing the same. Since at least two pieces of information can be stored per memory element, the degree of integration can be raised to 1.5 times to 2 times that in the conventional case because of the configuration in which the memory nodes are provided on the sides of the channel region. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004221584(A) 申请公布日期 2004.08.05
申请号 JP20040003687 申请日期 2004.01.09
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 RYU GENICHI;LEE JO-WON;IN SEUUKU;KIM CHUNU
分类号 H01L21/8247;H01L21/28;H01L21/336;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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