发明名称 Semiconductor device and manufacturing method thereof
摘要 A method of manufacturing a semiconductor device includes the steps of: forming an interlayer insulating film covering an upper side of a projected gate portion and a gap between the projected gate portions; forming a contact hole reaching a first bottom portion introduced into a semiconductor substrate, from an upper surface of the interlayer insulating film through the gap between the projected gate portions; forming a second bottom portion having the semiconductor substrate exposed on the bottom face and the side face by forming a diffusion prevention film covering a side face of the first bottom portion and by etching further the bottom face of the first bottom portion; and forming a plug by filling the contact hole with polysilicon having an impurity doped.
申请公布号 US2004152297(A1) 申请公布日期 2004.08.05
申请号 US20030623512 申请日期 2003.07.22
申请人 RENESAS TECHNOLOGY CORP. 发明人 OOTO KENICHI;TAKEUCHI MASAHIKO;TANAKA YOSHINORI
分类号 H01L21/28;H01L21/60;H01L21/768;H01L21/8234;H01L23/522;H01L27/088;H01L29/78;(IPC1-7):H01L21/476 主分类号 H01L21/28
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