发明名称 |
Semiconductor device and manufacturing method thereof |
摘要 |
A method of manufacturing a semiconductor device includes the steps of: forming an interlayer insulating film covering an upper side of a projected gate portion and a gap between the projected gate portions; forming a contact hole reaching a first bottom portion introduced into a semiconductor substrate, from an upper surface of the interlayer insulating film through the gap between the projected gate portions; forming a second bottom portion having the semiconductor substrate exposed on the bottom face and the side face by forming a diffusion prevention film covering a side face of the first bottom portion and by etching further the bottom face of the first bottom portion; and forming a plug by filling the contact hole with polysilicon having an impurity doped.
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申请公布号 |
US2004152297(A1) |
申请公布日期 |
2004.08.05 |
申请号 |
US20030623512 |
申请日期 |
2003.07.22 |
申请人 |
RENESAS TECHNOLOGY CORP. |
发明人 |
OOTO KENICHI;TAKEUCHI MASAHIKO;TANAKA YOSHINORI |
分类号 |
H01L21/28;H01L21/60;H01L21/768;H01L21/8234;H01L23/522;H01L27/088;H01L29/78;(IPC1-7):H01L21/476 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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