发明名称 METHOD AND SYSTEM FOR DYNAMIC MODELING AND RECIPE OPTIMIZATION OF SEMICONDUCTOR ETCH PROCESSES
摘要 A method and system are disclosed for creating dynamic models (7:760) of etch processes in semiconductor manufacturing. In one embodiment, a method comprises modeling an etch process used in semiconductor manufacturing to generate a dynamic process model. The dynamic process model is used to determine input values (7:720) that result in a desired output value. A process recipe (7:765) is optimized for the etch process with the input values.
申请公布号 WO2004021405(B1) 申请公布日期 2004.08.05
申请号 WO2003US27341 申请日期 2003.08.28
申请人 TOKYO ELECTRON LIMITED;LI, KUN;ERICKSON, MARK, A.;KANELLAKOPOULOS, IOANNIS 发明人 LI, KUN;ERICKSON, MARK, A.;KANELLAKOPOULOS, IOANNIS
分类号 G06F17/50;H01L21/311;H01L21/66;(IPC1-7):G06F9/45;G06F19/00;H01L21/476;H01L21/320 主分类号 G06F17/50
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