发明名称 Projection lens and microlithographic projection exposure apparatus
摘要 A projection exposure apparatus for microlithography has a light source, an illumination system, a mask-positioning system and a projection lens. The latter has a system aperture plane and an image plane and contains at least one lens that is made of a material which has a birefringence dependent on the transmission angle. The exposure apparatus further has an optical element, which has a position-dependent polarization-rotating effect or a position-dependent birefringence. This element, which is provided close to a pupil plane of the projection exposure apparatus, compensates at least partially for the birefringent effects produced in the image plane by the at least one lens.
申请公布号 US2004150806(A1) 申请公布日期 2004.08.05
申请号 US20030714573 申请日期 2003.11.14
申请人 BRUNOTTE MARTIN;HARTMAIER JURGEN;HOLDERER HUBERT;KAISER WINFRIED;KOHL ALEXANDER;KUGLER JENS;MAUL MANFRED;WAGNER CHRISTIAN 发明人 BRUNOTTE MARTIN;HARTMAIER JURGEN;HOLDERER HUBERT;KAISER WINFRIED;KOHL ALEXANDER;KUGLER JENS;MAUL MANFRED;WAGNER CHRISTIAN
分类号 G02B7/02;G02B1/02;G02B5/30;G03F7/20;H01L21/027;(IPC1-7):G03B27/54;G03B27/72 主分类号 G02B7/02
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