| 摘要 |
An object of the present invention is to provide a terminating resistor device and a testing method, by which the resistance value of a terminating resistor circuit can be test effectively. The test procedure starts with setting a MUXSCANFF circuit which functions as a selecting circuit in scan mode for test. Then, input a test signal to the scan input and/or clock input. Thereby, a particular resistor element for one bit only is set ON. By detecting the resistance value of this resistor element that has been set ON, it is test whether the one-bit resistance element conforms to manufacturing specification. Select another one of the one-bit resistor elements in order and test each one-bit resistor element, thereby testing all resistor elements.
|
