Active-matrix pixel drive circuit and inspection method therefor

摘要

In an active-drive type pixel structure comprising at least one TFT (Tr1) for control, one TFT (Tr2) for drive, and a capacitor (C1) for charge retention, it can be easily inspected whether the functions of TFTs and the capacitor are normal or not. In said active-drive type pixel structure, one terminal of a dummy load (W) for inspection is connected to a drain of the TFT for drive, and the other terminal of the load (W) is connected to a line (3) for inspection. By measuring an electric current (Id) obtained on the line (3) for inspection while changing a voltage supplied to a data line (2a), it can be inspected whether the functions of TFTs and the capacitor are normal or not. The dummy load (W) is configured to be melted and cut by burning off the load (W) with a laser beam or by passing a predetermined electric current in the load (W) after completion of inspection.