发明名称 High K dielectric film
摘要 A dielectric layer comprises lanthanum, aluminum, nitrogen, and oxygen and is formed between two conductors or a conductor and substrate. In one embodiment, the dielectric layer is graded with among the lanthanum, nitrogen, or aluminum. An additional insulating layer may be formed between the conductor or substrate and the dielectric layer. The dielectric layer can be formed by atomic layer chemical vapor deposition, physical vapor deposition, organometallic chemical vapor deposition or pulsed laser deposition.
申请公布号 US6770923(B2) 申请公布日期 2004.08.03
申请号 US20020099794 申请日期 2002.03.15
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 NGUYEN BICH-YEN;ZHOU HONG-WEI;WANG XIAO-PING
分类号 H01L21/316;H01L21/28;H01L21/318;H01L21/336;H01L21/822;H01L21/8238;H01L21/8242;H01L21/8247;H01L27/04;H01L27/092;H01L27/108;H01L27/115;H01L29/51;H01L29/78;H01L29/786;H01L29/788;H01L29/792;(IPC1-7):H01L29/76 主分类号 H01L21/316
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