发明名称 Non-volatile semiconductor memory structure
摘要 A non-volatile semiconductor memory cell structure and method of manufacture. The method includes the steps of forming a shallow first-type well layer, a second-type well layer and a deep first-type well layer over a substrate, forming stack gates over the shallow first-type well layer and finally forming source terminals and drain terminals. The source terminals penetrate through the shallow first-type well layer and connect with the second-type well layer. The drain terminals are close to the surface of the shallow first-type well layer. Both the source terminals and the drain terminals contain second type dopants.
申请公布号 US6770950(B2) 申请公布日期 2004.08.03
申请号 US20020099801 申请日期 2002.03.13
申请人 EMEMORY TECHNOLOGY INC. 发明人 YANG CHING-SONG;SHEN SHIH-JYE;HSU CHING-HSIANG
分类号 H01L21/8246;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L29/00 主分类号 H01L21/8246
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