发明名称 Method of forming a dielectric layer
摘要 Methods for fabricating a dielectric layer are provided. In one embodiment, a silicon-containing material is deposited on a substrate. The deposited material is processed with a reactive agent to react with silicon atoms of the deposited material to form the dielectric layer. The silicon-containing dielectric layer can allow for improved or smaller semiconductor devices. Improved or smaller semiconductor devices may be accomplished by reducing leakage and increasing the dielectric constant.
申请公布号 US6770574(B2) 申请公布日期 2004.08.03
申请号 US20020080119 申请日期 2002.02.21
申请人 MICRON TECHNOLOGY, INC. 发明人 POWELL DON CARL;MERCALDI GARRY ANTHONY
分类号 H01L21/314;H01L21/316;H01L29/78;(IPC1-7):H01L21/469 主分类号 H01L21/314
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