发明名称 |
Method of forming a dielectric layer |
摘要 |
Methods for fabricating a dielectric layer are provided. In one embodiment, a silicon-containing material is deposited on a substrate. The deposited material is processed with a reactive agent to react with silicon atoms of the deposited material to form the dielectric layer. The silicon-containing dielectric layer can allow for improved or smaller semiconductor devices. Improved or smaller semiconductor devices may be accomplished by reducing leakage and increasing the dielectric constant.
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申请公布号 |
US6770574(B2) |
申请公布日期 |
2004.08.03 |
申请号 |
US20020080119 |
申请日期 |
2002.02.21 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
POWELL DON CARL;MERCALDI GARRY ANTHONY |
分类号 |
H01L21/314;H01L21/316;H01L29/78;(IPC1-7):H01L21/469 |
主分类号 |
H01L21/314 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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